International Journal of Management Research and Social Science

International Journal of Management Research and Social Science

Altman Z, Messod Beneish M, Piotroski F-scores of Samsung Electronics Limited

Yazarlar: D. Sasikala

Cilt 8 , Sayı 1 , 2021 , Sayfalar -

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Anahtar Kelimeler:Bankruptcy Risk,Distress of Business Trend,Risk of Earnings Manipulation

Özet: This paper discusses about bankruptcy risk through Altman Z-score, distress of business trend through Piotroski F-Score, risk of earnings manipulation through Messod Beneish M-score models of Samsung Electronics Ltd. Altman Z-score model which is an accurate forecaster of failure up to two years prior to distress. It can be considered the assessment of the distress of industrial corporations, business trend (Piotroski F-Score), Messod Beneish M score can be used to detect the risk of earnings manipulation.

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@article{2021, title={Altman Z, Messod Beneish M, Piotroski F-scores of Samsung Electronics Limited}, volume={8}, number={0}, publisher={International Journal of Management Research and Social Science}, author={D. Sasikala}, year={2021} }
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D. Sasikala. (2021). Altman Z, Messod Beneish M, Piotroski F-scores of Samsung Electronics Limited (Vol. 8). Vol. 8. International Journal of Management Research and Social Science.
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D. Sasikala. Altman Z, Messod Beneish M, Piotroski F-Scores of Samsung Electronics Limited. no. 0, International Journal of Management Research and Social Science, 2021.
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